Kind of infrastructure
Platforms/Labs
Typology
Imaging/microscopy
University
Torino (UNITO)
Application / Industrial sector
Agrifood
Circular & Bioeconomy
Energy & environment
Health
Smart technologies
Location
Department
Department of Life Sciences and Systems Biology
Features
Equipment list
LAB-0121 Philips CM10
The Philips CM10 is a transmission electron microscope that allows observations routinely on contrasting samples, with negative staining etc.
It has a computerized controller, at a goniometric stage, capable to operate at low intensity.
The microscope is simple to use and generates high quality, high quality images
resolution with conventional voltages (from 60 to 100 Kv).
The Philips CM10 is a transmission electron microscope that allows observations routinely on contrasting samples, with negative staining etc.
It has a computerized controller, at a goniometric stage, capable to operate at low intensity.
The microscope is simple to use and generates high quality, high quality images
resolution with conventional voltages (from 60 to 100 Kv).
Available measurements
APPLICATION AND SERVICES
- The equipment is available for the observation of already prepared samples by the user, for exercises or demonstrations
- Transmission electron microscopy (TEM) uses an electron beam accelerated which, crossing the sectioned sample, allows the observer to obtain information on the structure and morphology of the sample
- TEM achieves much higher resolution than an optical microscope. It allows the observation of very thin samples (mostly sections prepared with a ultramicrotome), providing higher resolution images even than a scanning electron microscope, which can only be used for superficial scans
- The equipment is available for the observation of already prepared samples by the user, for exercises or demonstrations
- Transmission electron microscopy (TEM) uses an electron beam accelerated which, crossing the sectioned sample, allows the observer to obtain information on the structure and morphology of the sample
- TEM achieves much higher resolution than an optical microscope. It allows the observation of very thin samples (mostly sections prepared with a ultramicrotome), providing higher resolution images even than a scanning electron microscope, which can only be used for superficial scans
Contact
Person name
Silvano PANERO
Email
silvano.panero@unito.it