FIB-SEM ZEISS Crossbeam 350

SEM imaging is a technique used to obtain high-resolution images of surfaces at the nanoscale. A Scanning Electron Microscope (SEM) uses a focused beam of electrons to scan a sample, generating signals that reveal detailed information about its topography and structure.  Additionally, the Ion-sculptor FIB column revolutionizes FIB processing of milling by minimizing sample damage, enhancing quality, and accelerating experiments.