MATERIAL ELECTRON MICROSCOPY SERVICE

The Materials Electron Microscopy Service offers a set of sample preparation and electron microscopy observation services. These results are analyzed later by users based on their teaching, research and technological interests. The equipment allows the preparation of samples and the electron microscopy observation on all types of materials with scanning techniques with a spatial resolution of up to 0.8 nm, X-ray microanalysis, cathodoluminescence and EBSD detector. Currently, the offer in terms of transmission electron microscopy allows users to access transmission electron microscopes for general use from the LMA (Advanced Microscopy Laboratory, with whom the SAI works in collaboration.